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Nicolas Fil, Mohamed Belhaj, Julien Hillairet, and Jérôme Puech. Multipactor threshold sensitivity to total electron emission yield in small gap waveguide structure and TEEY models accuracy. Physics of Plasmas, 23(12):123118, December 2016. ISBN: 9781509006984. URL: https://doi.org/10.1063/1.4972571, doi:10.1063/1.4972571.

[FBHP20]

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